| Topics |
Organization |
Date |
|---|
| Construction of High Resolution X-Ray Diffractometer |
Caltech |
9/1987~6/1989 |
| Strain Measurement of Ion Implanted Silicon |
Caltech |
7/1988~6/1989 |
| Ion Beam Assisted Molecular Beam Epitaxy - SiGe system |
Caltech |
7/1989~6/1992 |
| Hot Filament Assisted CVD and Vapor-Liquid-Solid Growth of Diamond |
Harvard University |
7/1992~6/1993 |
| Curvature Measurement of Structure Relaxation of Amorphous Ge |
Harvard University |
7/1993~7/1994 |
| Hydrogenated Amorphous Si Characterization - sub-Project of Research on light-pen Based Digital Board |
Chung-Hsin University |
3/1995~7/1998 |
| Silicidation Process studied by curvature measurement |
Chung-Hsin University |
7/1996~present |
